Frank
Laboratory
of Neutron Physics

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Development of ion beam analysis technique at EG-5 accelerator

Leader: Pavel Prusachenko

Work phone number: +7 (496) 216-33-77

Work E-mail:  This email address is being protected from spambots. You need JavaScript enabled to view it. 

Scientific problem:

Investigation of the elemental composition of surface (units of µm-mm) layers of various materials is in demand in various fields of human activity, including the development of advanced materials for thermonuclear facilities. Under the ionizing irradiation, materials in contact with plasma are damaged and lose their properties; they accumulate elements produced as a result of nuclear reactions. Another major issue is mass transfer of elements that occurrs due to erosion and redeposition processes. The entry of elements from the walls of plasma chamber  into the plasma followed by redeposition results in changes in the physical properties of both the plasma itself and the control elements comprising the wall [1,2]. For the investigation of surfaces, analysis using accelerated ion beams (Ion Beam Analysis — IBA, nuclear microanalysis) is used. IBA is a family of advanced analytical techniques using ion beams with energies of the order of several MeV to investigate the composition and estimate depth profiles of elements in the surface layer of solids [3]. Quantitative information on the content and depth distribution of elements in the surface layer of the material under study depends on the analysis of the shape of energy spectra and the total number of registered products of nuclear reactions produced under the impact of accelerated ion beams. Literature: 1. Dmitriev, A.M. et al, Nuclear Materials and Energy 30 (2022) 101111; doi: https://doi.org/10.1016/j.nme.2021.101111. M. Mayer et al. «Ion Beam Analysis of fusion plasma-facing materials and components: Facilities and Research Challenges», Nuclear Fusion 60 (2020) 025001 3. Handbook of Modern Ion Beam Materials Analysis, edited by Y. Wang and M. Nastasi (MRS, Warrendale, 2009).

Objective: 

Analysis of the elemental composition of the surface layer of a sample.

Tasks:

1. Learning about the IBR-2 policy.
2. Learning the SIMNRA programme.
3. Development of software for data processing.
4. Processing data from a real sample.
5. Writing a thesis.

Research facilities: 

EG-5